| Publication CODE |
Title |
| IEC 60747-5-8:2019 (2019-11) |
SEMICONDUCTOR DEVICES - PART 5-8: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES - TEST METHOD OF OPTOELECTRONIC EFFICIENCIES OF LIGHT EMITTING DIODES |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
36. |
Description
IEC 60747-5-8:2019 specifies the terminology and the measuring methods of various efficiencies of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this part of IEC 60747. The efficiencies whose measuring methods are defined in this part are the power efficiency (PE), the external quantum efficiency (EQE), the voltage efficiency (VE), and the light extraction efficiency (LEE). To measure the LEE, the measurement data of the internal quantum efficiency (IQE) is used, whose measuring method is discussed in IEC 60747-5-9 and IEC 60747-5-10. The injection efficiency (IE) and the radiative efficiency (RE) are given definitions only.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-11-13 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2019-11-13 |
| IEC stability date |
2024-12-31 |
| IEC file modification date |
2019-11-13 |
| IEC last modification date |
2019-11-13 |
|
