| Publication CODE |
Title |
| NBN EN 62435-2:2017 (2017-04) |
ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 2: DETERIORATION MECHANISMS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
3. |
Description
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.
|
| Class |
C
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 62435-2:2017.
For the series NBN EN 50XXX, the standards are however complete.
|
DE version
|
EN version
|
FR version
|
|
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2017-02-28 |
| NBN Approval |
2017-06-21 |
| Registration |
176653 |
| ICS-Code (International Standards Classification) |
31.020
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2017-02-28 |
| Date of availability (d.a.v.) |
2017-04-28 |
| Date of announcement (d.o.a.) |
2017-05-28 |
| Date of publication (d.o.p.) |
2017-11-28 |
| Date of withdrawal former edition (d.o.w.) |
2020-02-28 |
|
