| Publication CODE |
Title |
| IEC 60749-4:2002 (2002-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST) |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
21.00 €
|
15. |
Description
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
The contents of the corrigendum of August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-04-12 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2002-04-12 |
| IEC stability date |
2016-12-31 |
| IEC last modification date |
2017-03-03 |
|
