| Publication CODE |
Title |
| IEC 60749-34:2004 (2004-03) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
21. |
Description
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2004-03-21 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2004-03-10 |
| IEC last modification date |
2010-10-28 |
|
