| Publication CODE |
Title |
| IEC 62374-1:2010 (2010-09) |
SEMICONDUCTOR DEVICES - PART 1: TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST FOR INTER-METAL LAYERS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
32 P. |
Description
IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2010-09-29 |
| Registration |
0 |
| ICS-Code (International Standards Classification) |
31.080.99
|
|
| IEC publication date |
2010-09-29 |
| IEC stability date |
2025-12-31 |
| IEC last modification date |
2018-11-22 |
|
