Account:  - Login  |  Webstore  |  Shopping basket cart
English  |  Français  |  Nederlands

Publication details

Publication CODE Title
IEC 60749-22:2002/COR1:2003 (2003-08) CORRIGENDUM 1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 22: BOND STRENGTH
 
Price Excl. VAT Total number of pages, tables and drawings
0.00 € 0.
Description
[Text at this stage is not available in English]
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
 
ATTENTION: With some browsers, you may experience problems if you open the downloaded file directly. If you experience this problem, please first save the file locally and then open it
Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2003-08-13
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2003-08-13
IEC stability date 2025-12-31
IEC last modification date 2018-01-11