| Publication CODE |
Title |
| IEC PAS 62181:2000 (2000-07) |
IC LATCH-UP TEST |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
19. |
Description
Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-07-21 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-07-21 |
| IEC last modification date |
2003-11-04 |
|
