| Publication CODE |
Title |
| IEC TR 62878-2-2:2015 (2015-12) |
DEVICE EMBEDDED SUBSTRATE - PART 2-2: GUIDELINES - ELECTRICAL TESTING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
29 P.. |
Description
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 91
ELECTRONICS ASSEMBLY TECHNOLOGY
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2015-12-04 |
| ICS-Code (International Standards Classification) |
31.180
, 31.190
|
| NBN Status |
New |
|
| IEC publication date |
2015-12-04 |
| IEC stability date |
2020-12-31 |
| IEC file modification date |
2015-11-30 |
| IEC last modification date |
2015-12-04 |
|
