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Publication details

Publication CODE Title
IEC 62416:2010 (2010-04) SEMICONDUCTOR DEVICES - HOT CARRIER TEST ON MOS TRANSISTORS
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 20 P.
Description
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2010-04-26
Registration 106125
ICS-Code (International Standards Classification) 31.080.30
NBN Status New
IEC publication date 2010-04-26
IEC stability date 2025-12-31
IEC last modification date 2018-11-22