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Publication details

Publication CODE Title
IEC 61000-4-20:2003 (2003-01) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING in TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES
 
Price Excl. VAT Total number of pages, tables and drawings
307.00 € 129.
Description
Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe ∑ TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); ∑ TEM waveguide validation methods for EMC measurements; ∑ the EUT (i.e. EUT cabinet and cabling) definition; ∑ test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and ∑ test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. It has the status of a basic EMC publication in accordance with IEC Guide 107.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 61000-4-20:2010
Origin
Committee CIS/A
RADIO-INTERFERENCE MEASUREMENTS AND STATISTICAL METHODS
Responsible Ir DELENS Marc
Approval
BEC Approval 2003-01-29
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 2003-01-29
IEC last modification date 2010-08-31