| Publication CODE |
Title |
| NBN EN 60749-42:2014 (2014-10) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
PART 42: TEMPERATURE AND HUMIDITY STORAGE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
3 P. |
Description
Provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.
|
| Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-42:2014.
For the series NBN EN 50XXX, the standards are however complete.
|
EN version
|
FR version
|
DE version
|
|
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2014-09-16 |
| NBN Approval |
2014-11-28 |
| Belgian Official Journal |
2015-01-30 |
| Registration |
149141 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2014-09-16 |
| Date of availability (d.a.v.) |
2014-10-03 |
| Date of announcement (d.o.a.) |
2014-12-16 |
| Date of publication (d.o.p.) |
2015-06-16 |
| Date of withdrawal former edition (d.o.w.) |
2017-09-16 |
|
