Publication CODE |
Title |
NBN EN 60749-7:2011 (2011-09) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES |
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Price Excl. VAT |
Total number of pages, tables and drawings |
25.00 €
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2 P. |
Description
Specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
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Class |
C86
(ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-7:2011.
For the series NBN EN 50XXX, the standards are however complete.
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EN version
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FR version
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DE version
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|
Status |
Registered trilingual Belgian standard EN or FR or DE |
Situation |
Currently active
Replaces
NBN EN 60749-7:2002
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Committee |
TC 47
SEMICONDUCTOR DEVICES
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Responsible |
Ir DELENS Marc
|
BEC Approval |
2011-07-22 |
NBN Approval |
2011-10-21 |
Belgian Official Journal |
2011-11-29 |
Registration |
117005 |
ICS-Code (International Standards Classification) |
31.080.01
|
NBN Status |
New |
|
Date of ratification (d.o.r.) |
2011-07-22 |
Date of availability (d.a.v.) |
2011-09-09 |
Date of announcement (d.o.a.) |
2011-10-22 |
Date of publication (d.o.p.) |
2012-04-22 |
Date of withdrawal former edition (d.o.w.) |
2014-07-22 |
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