| Publication CODE |
Title |
| IEC 60747-5-14:2022 (2022-03) |
SEMICONDUCTOR DEVICES - PART 5-14: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES - TEST METHOD OF THE SURFACE TEMPERATURE BASED ON THE THERMOREFLECTANCE METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
21. |
Description
IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2022-03-04 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2022-03-04 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2022-03-04 |
| IEC last modification date |
2022-03-04 |
|
