| Publication CODE |
Title |
| IEC PAS 62163:2000 (2000-08) |
EXTERNAL VISUAL TEST METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
11.00 €
|
3. |
Description
The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External Visual is a non-destructive test and applicable for all package types.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-22 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-08-22 |
| IEC last modification date |
2003-06-13 |
|
