| Publication CODE |
Title |
| IEC TS 63202-2:2021 (2021-12) |
PHOTOVOLTAIC CELLS - PART 2: ELECTROLUMINESCENCE IMAGING OF CRYSTALLINE SILICON SOLAR CELLS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
19. |
Description
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 82
SOLAR PHOTOVOLTAIC ENERGY SYSTEMS
|
| Responsible |
De heer VAN HECKE Luk
|
| BEC Approval |
2021-12-16 |
| ICS-Code (International Standards Classification) |
27.160
|
| NBN Status |
New |
|
| IEC publication date |
2021-12-16 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2021-12-16 |
| IEC last modification date |
2021-12-16 |
|
