Publication CODE |
Title |
IEC 61164:1995 (1995-06) |
RELIABILITY GROWTH - STATISTICAL TEST AND ESTIMATION METHODS |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
249.00 €
|
61. |
Description
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Committee |
TC 56
DEPENDABILITY
|
Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
BEC Approval |
1995-06-27 |
ICS-Code (International Standards Classification) |
35.040
|
NBN Status |
New |
|
IEC publication date |
1995-06-27 |
IEC last modification date |
2004-03-24 |
|