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Publication details

Publication CODE Title
IEC 60749-17:2019 (2019-03) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
 
Price Excl. VAT Total number of pages, tables and drawings
42.00 € 17.
Description
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Replaces  IEC 60749-17:2003
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2019-03-28
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
IEC publication date 2019-03-28
IEC stability date 2022-12-31
IEC file modification date 2019-03-28
IEC last modification date 2019-03-28