| Publication CODE |
Title |
| IEC 62951-9:2022 (2022-12) |
SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 9: PERFORMANCE TESTING METHODS OF ONE TRANSISTOR AND ONE RESISTOR (1T1R) RESISTIVE MEMORY CELLS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
18. |
Description
IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2022-12-14 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2022-12-14 |
| IEC stability date |
2026-12-31 |
| IEC file modification date |
2022-12-14 |
| IEC last modification date |
2022-12-14 |
|
