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Publication details

Publication CODE Title
IEC PAS 62203:2000 (2000-11) GUIDE FOR THE STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER-LEVEL ELECTRICAL TESTING
 
Price Excl. VAT Total number of pages, tables and drawings
21.00 € 6.
Description
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN version

Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2000-11-28
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 2000-11-28
IEC last modification date 2004-05-17