Publication CODE |
Title |
IEC PAS 62203:2000 (2000-11) |
GUIDE FOR THE STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER-LEVEL ELECTRICAL TESTING |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
21.00 €
|
6. |
Description
Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Status |
IEC PUBLICATION |
Situation |
Withdrawn
|
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2000-11-28 |
ICS-Code (International Standards Classification) |
35.040
|
NBN Status |
New |
|
IEC publication date |
2000-11-28 |
IEC last modification date |
2004-05-17 |
|