| Publication CODE |
Title |
| IEC TS 61945:2000 (2000-03) |
INTERATED CIRCUITS - MANUFACTURING LINE APPROVAL - METHODOLOGY FOR TECHNOLOGY AND FAILURE ANALYSIS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
42.00 €
|
23. |
Description
Gives the methodology for technology and failure analysis in manufacturing integrated circuits.
Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
TECHNICAL SPECIFICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47A
INTEGRATED CIRCUITS
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-03-10 |
| ICS-Code (International Standards Classification) |
31.200
|
|
| IEC publication date |
2000-03-10 |
| IEC stability date |
2022-12-31 |
| IEC last modification date |
2018-07-10 |
|
