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Publication details

Publication CODE Title
IEC 62132-1:2006 (2006-01) INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY, 150 kHz TO 1 GHz - PART 1: GENERAL CONDITIONS AND DEFINITIONS
 
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Description
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 62132-1:2015
Origin
Committee TC 47/SC 47A
INTEGRATED CIRCUITS
Responsible Ir DELENS Marc
Approval
BEC Approval 2006-01-19
ICS-Code (International Standards Classification) 31.200
IEC publication date 2006-01-19
IEC stability date 2017-12-31
IEC last modification date 2015-10-29