Publication details
| Publication CODE |
Title |
| NBN EN IEC 60749-28:2022 (2022-04) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL |
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| Price Excl. VAT |
Total number of pages, tables and drawings |
|
12.00 €
|
2. |
Description
IEC 60749-28:2022 is available as IEC 60749-28:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-28:2022 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex J. The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels. This edition includes the following significant technical changes with respect to the previous edition:
- a new subclause and annex relating to the problems associated with CDM testing of integrated circuits and discrete semiconductors in very small packages;
- changes to clarify cleaning of devices and testers.
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| Class |
C
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
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DE version
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EN version
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FR version
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Status
Origin
| Committee |
CLC/SR 47
Semiconductor devices
|
Approval
| BEC Approval |
2022-04-05 |
| NBN Approval |
2022-04-13 |
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2022-04-05 |
| Date of announcement (d.o.a.) |
2022-07-05 |
| Date of publication (d.o.p.) |
2023-01-05 |
| Date of withdrawal former edition (d.o.w.) |
2025-04-05 |
| IEC file modification date |
2022-04-09 |
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