| Publication CODE |
Title |
| NBN EN IEC 63287-2:2023 (2023-05) |
SEMICONDUCTOR DEVICES - GUIDELINES FOR RELIABILITY QUALIFICATION PLANS - PART 2: CONCEPT OF MISSION PROFILE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
14.00 €
|
3. |
Description
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
|
| Class |
C
|
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
|
|
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
CLC/SR 47
Semiconductor devices
|
| BEC Approval |
2023-05-03 |
| NBN Approval |
2023-05-17 |
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2023-05-03 |
| Date of announcement (d.o.a.) |
2023-08-03 |
| Date of publication (d.o.p.) |
2024-02-03 |
| Date of withdrawal former edition (d.o.w.) |
2026-05-03 |
| IEC file modification date |
2023-05-13 |
|
