| Publication CODE |
Title |
| IEC 61163-1:2006 (2006-06) |
RELIABILITY STRESS SCREENING - PART 1: REPAIRABLE ASSEMBLIES MANUFACTURED in LOTS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
366.00 €
|
161. |
Description
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 56
DEPENDABILITY
|
| Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
| BEC Approval |
2006-06-26 |
| ICS-Code (International Standards Classification) |
03.120.01
, 03.120.30
, 21.020
|
|
| IEC publication date |
2006-06-26 |
| IEC stability date |
2023-12-31 |
| IEC last modification date |
2017-11-02 |
|
