| Publication CODE |
Title |
| IEC 60749-3:2002/COR1:2003 (2003-08) |
CORRIGENDUM 1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
0.00 €
|
0. |
Description
Modification of the validity date: now put at 2007.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2003-08-12 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2003-08-12 |
| IEC stability date |
2016-12-31 |
| IEC last modification date |
2017-03-03 |
|
