Publication CODE |
Title |
IEC 61163-2:1998 (1998-11) |
RELIABILITY STRESS SCREENING - PART 2: ELECTRONIC COMPONENTS |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
249.00 €
|
69. |
Description
Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Committee |
TC 56
DEPENDABILITY
|
Responsible |
Monsieur DE LEEUW Thierry, Technical Officer
Diamant Building
Bd Auguste Reyers, 80
1030
BRUXELLES
Phone: +32 2 706 85 72
E-mail: thierry.deleeuw@ceb-bec.be
|
BEC Approval |
1998-11-27 |
ICS-Code (International Standards Classification) |
03.120.01
, 31.020
|
|
IEC publication date |
1998-11-27 |
IEC stability date |
2022-12-31 |
IEC last modification date |
2019-10-29 |
|