| Publication CODE |
Title |
| IEC 62047-29:2017 (2017-11) |
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 29: ELECTROMECHANICAL RELAXATION TEST METHOD FOR FREESTANDING CONDUCTIVE THIN-FILMS UNDER ROOM TEMPERATURE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
12. |
Description
IEC 62047-29:2017(E) specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin films of conductive materials are extensively utilized in MEMS, opto-electronics, and flexible/wearable electronics products. Freestanding thin films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47F
MICRO-ELECTROMECHANICAL SYSTEMS
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2017-11-22 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2017-11-22 |
| IEC stability date |
2021-12-31 |
| IEC file modification date |
2017-11-22 |
| IEC last modification date |
2017-12-14 |
|
