Publication CODE |
Title |
IEC 60749:1996 (1996-10) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
286.00 €
|
95. |
Description
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
|
Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
Committee |
TC 47
SEMICONDUCTOR DEVICES
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
1996-10-28 |
ICS-Code (International Standards Classification) |
31.080.01
|
NBN Status |
New |
|
IEC publication date |
1996-10-28 |
IEC last modification date |
2017-08-23 |
|