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Publication details

Publication CODE Title
NBN EN 62047-12:2011 (2011-10) SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES PART 12: BENDING FATIGUE TESTING METHOD OF THIN FILM MATERIALS USING RESONANT VIBRATION OF MEMS STRUCTURES
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 3 P.
Description
Specifies a method for bending fatigue testing using resonant vibration of microscale mechanical structures of MEMS (micro-electromechanical systems) and micromachines. This standard applies to vibrating structures ranging in size from 10 µm to 1 000 µm in the plane direction and from 1 µm to 100 µm in thickness, and test materials measuring under 1 mm in length, under 1 mm in width, and between 0,1 µm and 10 µm in thickness. The main structural materials for MEMS, micromachine, etc. have special features, such as typical dimensions of a few microns, material fabrication by deposition, and test piece fabrication by means of non-mechanical machining, including photolithography. The MEMS structures often have higher fundamental resonant frequency and higher strength than macro structures. To evaluate and assure the lifetime of MEMS structures, a fatigue testing method with ultra high cycles (up to 1012) loadings needs to be established. The object of the test method is to evaluate the mechanical fatigue properties of microscale materials in a short time by applying high load and high cyclic frequency bending stress using resonant vibration.
Class  C96  (TELECOMMUNICATIONS - ELECTRONIC MICRO ELECTRONICS - DISCRETE SEMICONDUCTOR DEVICES)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 62047-12:2011. For the series NBN EN 50XXX, the standards are however complete.

EN version
FR version
DE version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Currently active
Origin
Committee TC 47/SC 47F
MICRO-ELECTROMECHANICAL SYSTEMS
Responsible Ir DELENS Marc
Approval
BEC Approval 2011-10-18
NBN Approval 2011-12-14
Belgian Official Journal 2012-01-20
Registration 117529
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
Date of ratification (d.o.r.) 2011-10-18
Date of availability (d.a.v.) 2011-10-21
Date of announcement (d.o.a.) 2012-01-18
Date of publication (d.o.p.) 2012-07-18
Date of withdrawal former edition (d.o.w.) 2014-10-18
Correspondences with international standards
Relation International standard Date
is identical to EN 62047-12:2011 2011-10-21
is identical to IEC 62047-12:2011/ed. 1.0 2011-09-13
Relations to belgian/foreign publications
Type Origin Code Date
Standard Foreign ISO 12107
Standard Belgium NBN EN 62047-3