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Publication details

Publication CODE Title
IEC 62047-21:2014 (2014-06) SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 21: TEST METHOD FOR POISSON'S RATIO OF THIN FILM MEMS MATERIALS
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 26 P.
Description
IEC 62047-21:2014 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 µm.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Currently active
Origin
Committee TC 47/SC 47F
MICRO-ELECTROMECHANICAL SYSTEMS
Responsible Ir DELENS Marc
Approval
BEC Approval 2014-06-19
ICS-Code (International Standards Classification) 31.080.99
NBN Status New
IEC publication date 2014-06-19
IEC stability date 2022-12-31
IEC file modification date 2014-06-16
IEC last modification date 2017-11-15