| Publication CODE |
Title |
| IEC PAS 62186:2000 (2000-08) |
MECHANICAL SHOCK TEST METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
11.00 €
|
3. |
Description
This test is intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. It is normally applicable to cavity-type packages.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-08-24 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-08-24 |
| IEC last modification date |
2009-08-18 |
|
