| Publication CODE |
Title |
| IEC 63287-2:2023 (2023-03) |
SEMICONDUCTOR DEVICES - GUIDELINES FOR RELIABILITY QUALIFICATION PLANS - PART 2: CONCEPT OF MISSION PROFILE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
30. |
Description
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2023-03-29 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| IEC publication date |
2023-03-29 |
| IEC stability date |
2027-12-31 |
| IEC file modification date |
2023-03-29 |
| IEC last modification date |
2023-03-29 |
|
