Publication CODE |
Title |
NBN EN 62215-3:2013 (2013-10) |
INTEGRATED CIRCUITS - MEASUREMENT OF IMPULSE IMMUNITY
PART 3: NON-SYNCHRONOUS TRANSIENT INJECTION METHOD |
|
Price Excl. VAT |
Total number of pages, tables and drawings |
25.00 €
|
3 P. |
Description
Specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
|
Class |
C93
(TELECOMMUNICATIONS - ELECTRONIC PASSIVE ELECTRONIC COMPONENTS AND OPTICAL FIBRES (SEE ALSO C90))
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 62215-3:2013.
For the series NBN EN 50XXX, the standards are however complete.
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EN version
|
FR version
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DE version
|
|
Status |
Registered trilingual Belgian standard EN or FR or DE |
Situation |
Currently active
|
|
Committee |
TC 47/SC 47A
INTEGRATED CIRCUITS
|
Responsible |
Ir DELENS Marc
|
BEC Approval |
2013-08-21 |
NBN Approval |
2013-12-19 |
Belgian Official Journal |
2014-03-14 |
Registration |
145089 |
ICS-Code (International Standards Classification) |
31.200
|
NBN Status |
New |
|
Date of ratification (d.o.r.) |
2013-08-21 |
Date of availability (d.a.v.) |
2013-10-04 |
Date of announcement (d.o.a.) |
2013-11-21 |
Date of publication (d.o.p.) |
2014-05-21 |
Date of withdrawal former edition (d.o.w.) |
2016-08-21 |
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