Account:  - Login  |  Webstore  |  Shopping basket cart
English  |  Français  |  Nederlands

Publication details

Publication CODE Title
IEC 60147-2:1963 (1963-01) ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS - PART 2: GENERAL PRINCIPLES OF MEASURING METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
201.00 € 55 P.
Description
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 1963-01-01
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 1963-01-01
IEC last modification date 2013-07-03