| Publication CODE |
Title |
| IEC 60749-8:2002 (2002-08) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
31. |
Description
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2002-08-30 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2002-08-30 |
| IEC stability date |
2024-12-31 |
| IEC last modification date |
2019-11-20 |
|
