| Publication CODE |
Title |
| IEC TS 62876-2-1:2018 (2018-08) |
NANOTECHNOLOGY - RELIABILITY ASSESSMENT - PART 2-1: NANO-ENABLED PHOTOVOLTAIC DEVICES - STABILITY TEST |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
30. |
Description
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 113
NANOTECHNOLOGY STANDARDISATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS
|
| BEC Approval |
2018-08-29 |
| ICS-Code (International Standards Classification) |
07.120
, 27.160
|
| NBN Status |
New |
|
| IEC publication date |
2018-08-29 |
| IEC stability date |
2020-12-31 |
| IEC file modification date |
2018-08-29 |
| IEC last modification date |
2020-01-02 |
|
