| Publication CODE |
Title |
| IEC TS 62607-5-3:2020 (2020-04) |
NANOMANUFACTURING - KEY CONTROL CHARACTERISTICS - PART 5-3: THIN-FILM ORGANIC/NANO ELECTRONIC DEVICES - MEASUREMENTS OF CHARGE CARRIER CONCENTRATION |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
20. |
Description
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 113
NANOTECHNOLOGY STANDARDISATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS
|
| BEC Approval |
2020-04-14 |
| ICS-Code (International Standards Classification) |
07.030
, 07.120
|
| NBN Status |
New |
|
| IEC publication date |
2020-04-14 |
| IEC stability date |
2022-12-31 |
| IEC file modification date |
2020-04-14 |
| IEC last modification date |
2020-04-14 |
|
