| Publication CODE |
Title |
| IEC TS 62607-6-14:2020 (2020-10) |
NANOMANUFACTURING - KEY CONTROL CHARACTERISTICS - PART 6-14: GRAPHENE-BASED MATERIAL - DEFECT LEVEL: RAMAN SPECTROSCOPY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
28. |
Description
IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic
' defect level
for powders consisting of graphene-based material by
' Raman spectroscopy.
The defect level is derived by the intensity ratio of the D+D' band and 2D band in Raman spectrum, ID+D'/I2D.
' The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.
' The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.
' Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.
' The method described in this document is appropriate if the physical form of graphene is powder.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 113
NANOTECHNOLOGY STANDARDISATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS
|
| BEC Approval |
2020-10-27 |
| ICS-Code (International Standards Classification) |
07.120
|
| NBN Status |
New |
|
| IEC publication date |
2020-10-27 |
| IEC stability date |
2022-12-31 |
| IEC file modification date |
2020-10-27 |
| IEC last modification date |
2020-10-27 |
|
