| Publication CODE |
Title |
| IEC TS 62607-6-20:2022 (2022-10) |
NANOMANUFACTURING - KEY CONTROL CHARACTERISTICS - PART 6-20: GRAPHENE-BASED MATERIAL - METALLIC IMPURITY CONTENT: INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
201.00 €
|
28. |
Description
IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic
- metallic impurity content
for powders of graphene-based materials by
- inductively coupled plasma mass spectrometry (ICP-MS).
The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS.
- The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO).
' The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 113
NANOTECHNOLOGY STANDARDISATION FOR ELECTRICAL AND ELECTRONIC PRODUCTS AND SYSTEMS
|
| BEC Approval |
2022-10-11 |
| ICS-Code (International Standards Classification) |
07.120
|
| NBN Status |
New |
|
| IEC publication date |
2022-10-11 |
| IEC stability date |
2024-12-31 |
| IEC file modification date |
2022-10-11 |
| IEC last modification date |
2022-10-11 |
|
