| Publication CODE |
Title |
| IEC 60147-2E:1973 (1973-01) |
SUPPLEMENT e - ESSENTIAL RATINGS AND CHARACTERISTICS OF
SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS -
PART 2: GENERAL PRINCIPLES OF MEASURING METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
249.00 €
|
65 P. |
Description
[Text at this stage is not available in English]
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1973-01-01 |
| ICS-Code (International Standards Classification) |
31.080.10
|
| NBN Status |
New |
|
| IEC publication date |
1973-01-01 |
| IEC last modification date |
2017-08-23 |
|
