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Publication details

Publication CODE Title
IEC 60147-2M:1980 (1980-01) SUPPLEMENT m - ESSENTIAL RATINGS AND CHARACTERISTICS OF SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS - PART 2: GENERAL PRINCIPLES OF MEASURING METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
249.00 € 73 P.
Description
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version
Status
Status IEC PUBLICATION
Situation Withdrawn
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 1980-01-01
ICS-Code (International Standards Classification) 31.080.10
NBN Status New
IEC publication date 1980-01-01
IEC last modification date 2014-12-10