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Publication details

Publication CODE Title
IEC 60749-26:2003 (2003-10) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)
 
Price Excl. VAT Total number of pages, tables and drawings
85.00 € 27.
Description
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Replaced by  IEC 60749-26:2006
Replaces  IEC PAS 62179:2000
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2003-10-21
ICS-Code (International Standards Classification) 35.040
NBN Status New
IEC publication date 2003-10-21
IEC last modification date 2006-07-18