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Publication details

Publication CODE Title
IEC 60747-5-3:1997 (1997-09) DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS
 
Price Excl. VAT Total number of pages, tables and drawings
249.00 € 61.
Description
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Class  C990  (IEC PUBLICATIONS IEC PUBLICATIONS)
Available files
EN/FR version

Status
Status IEC PUBLICATION
Situation Withdrawn
Partly replaced by  IEC 60747-5-4:2006
Partly replaced by  IEC 60747-5-6:2016
Partly replaced by  IEC 60747-5-5:2007
Partly replaced by  IEC 60747-5-7:2016
Replaced by  IEC 60747-5-4:2006
Replaced by  IEC 60747-5-5:2007
Replaced by  IEC 60747-5-7:2016
Replaced by  IEC 60747-5-6:2016
Partly replaces  IEC 60747-5:1992
Partly replaces  IEC 60747-5:1992/AMD1:1994
Partly replaces  IEC 60747-5:1992/AMD2:1995
Origin
Committee TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 1997-09-05
ICS-Code (International Standards Classification) 31.260
IEC publication date 1997-09-05
IEC stability date 2013-12-31
IEC last modification date 2017-08-23