Publication details
| Publication CODE |
Title |
| NBN EN 60749-28:2017 (2017-06) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
25.00 €
|
2. |
Description
IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto-electronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this document. To perform the tests, the devices are assembled into a package similar to that expected in the final application. This CDM document does not apply to socketed discharge model testers. This document describes the field-induced (FI) method. An alternative, the direct contact (DC) method, is described in Annex I.
The purpose of this document is to establish a test method that will replicate CDM failures and provide reliable, repeatable CDM ESD test results from tester to tester, regardless of device type. Repeatable data will allow accurate classifications and comparisons of CDM ESD sensitivity levels.
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| Class |
C
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Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally
only available in English or French. Only the cover page is translated
and the document itself is in English or in French.
Very important notice: 98% of the text of the NBN EN 55XXX,
NBN EN 6XXXX comes from the IEC text which is NOT included.
This text can be ordered here:
IEC 60749-28:2017.
For the series NBN EN 50XXX, the standards are however complete.
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DE version
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EN version
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FR version
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Status
| Status |
Registered trilingual Belgian standard EN or FR or DE |
| Situation |
valid till 2025-04-05
Replaced by
NBN EN IEC 60749-28:2022
|
|
Origin
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
Approval
| BEC Approval |
2017-05-02 |
| NBN Approval |
2017-08-23 |
| Registration |
176984 |
| ICS-Code (International Standards Classification) |
31.080.01
|
| NBN Status |
New |
|
| Date of ratification (d.o.r.) |
2017-05-02 |
| Date of availability (d.a.v.) |
2017-06-30 |
| Date of announcement (d.o.a.) |
2017-08-02 |
| Date of publication (d.o.p.) |
2018-02-02 |
| Date of withdrawal former edition (d.o.w.) |
2020-05-02 |
|
Correspondences with international standards
| Relation |
International standard |
Date |
| is identical to |
EN 60749-28:2017
|
2017-06-30 |
| is identical to |
IEC 60749-28:2017
|
2017-03-28 |
|
