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Publication details

Publication CODE Title
NBN EN 60749-4:2002 (2002-08) SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
 
Price Excl. VAT Total number of pages, tables and drawings
25.00 € 2 P..
Description
[Text at this stage is not available in English]
Class  C86  (ELECTRONIC COMPONENTS MICRO ELECTRONICS - DISCRETE SEMICONDUCTORS)
Available files
ATTENTION: Belgian registered standards (NBN EN or NBN HD) are generally only available in English or French. Only the cover page is translated and the document itself is in English or in French.

Very important notice: 98% of the text of the NBN EN 55XXX, NBN EN 6XXXX comes from the IEC text which is NOT included. This text can be ordered here: IEC 60749-4:2002. For the series NBN EN 50XXX, the standards are however complete.

EN version
FR version
DE version
Status
Status Registered trilingual Belgian standard EN or FR or DE
Situation Withdrawn
Replaced by  NBN EN 60749-4:2017
Partly replaces  NBN EN 60749:1999
Partly replaces  NBN EN 60749:1999/A1:2001
Partly replaces  NBN EN 60749:1999/A2:2002
Origin
Committee TC 47
SEMICONDUCTOR DEVICES
Responsible Ir DELENS Marc
Approval
BEC Approval 2002-07-02
NBN Approval 2002-10-09
Registration 25001
ICS-Code (International Standards Classification) 31.080.01
NBN Status New
Date of ratification (d.o.r.) 2002-08-13
Date of availability (d.a.v.) 2002-08-13
Date of announcement (d.o.a.) 2002-10-01
Date of publication (d.o.p.) 2003-04-01
Date of withdrawal former edition (d.o.w.) 2005-07-01
Correspondences with international standards
Relation International standard Date
is identical to EN 60749-4:2002 2002-08-01
is identical to IEC 60749-4:2002/ed. 1.0 2002-04-01