| Publication CODE |
Title |
| IEC 60749-35:2006 (2006-07) |
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 35: ACOUSTIC MICROSCOPY FOR PLASTIC ENCAPSULATED ELECTRONIC COMPONENTS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
159.00 €
|
43. |
Description
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2006-07-18 |
| ICS-Code (International Standards Classification) |
31.080.01
|
|
| IEC publication date |
2006-07-18 |
| IEC stability date |
2024-12-31 |
| IEC last modification date |
2019-11-20 |
|
