| Publication CODE |
Title |
| IEC 60147-2M:1980 (1980-01) |
SUPPLEMENT m - ESSENTIAL RATINGS AND CHARACTERISTICS OF
SEMICONDUCTOR DEVICES AND GENERAL PRINCIPLES OF MEASURING METHODS -
PART 2: GENERAL PRINCIPLES OF MEASURING METHODS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
249.00 €
|
73 P. |
Description
Deals with measuring methods for signal and voltageregulator diodes, bipolar and field-effect transistors. Some methods, formerly described, are brought up to date according to more modern techniques or equipment; some others are newly described.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
1980-01-01 |
| ICS-Code (International Standards Classification) |
31.080.10
|
| NBN Status |
New |
|
| IEC publication date |
1980-01-01 |
| IEC last modification date |
2014-12-10 |
|
