| Publication CODE |
Title |
| IEC PAS 62191:2000 (2000-11) |
ACOUSTIC MICROSCOPY FOR NONHERMETIC ENCAPSULATED ELECTRONIC COMPONENTS |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
85.00 €
|
16. |
Description
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Withdrawn
|
|
| Committee |
TC 47
SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2000-11-28 |
| ICS-Code (International Standards Classification) |
35.040
|
| NBN Status |
New |
|
| IEC publication date |
2000-11-28 |
| IEC last modification date |
2009-08-18 |
|
