| Publication CODE |
Title |
| IEC 60747-5-9:2019 (2019-12) |
SEMICONDUCTOR DEVICES - PART 5-9: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES - TEST METHOD OF THE INTERNAL QUANTUM EFFICIENCY BASED ON THE TEMPERATURE-DEPENDENT ELECTROLUMINESCENCE |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
122.00 €
|
19. |
Description
IEC 60747-5-9:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the relative external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an operating temperature, which is called temperature-dependent electroluminescence (TDEL). In order to identify the reference IQE of 100 %, the maximum values of the peak EQE are found by varying the environmental temperature and current.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47E
DISCRETE SEMICONDUCTOR DEVICES
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2019-12-11 |
| ICS-Code (International Standards Classification) |
31.080.99
|
| NBN Status |
New |
|
| IEC publication date |
2019-12-11 |
| IEC stability date |
2025-12-31 |
| IEC file modification date |
2019-12-11 |
| IEC last modification date |
2019-12-20 |
|
