| Publication CODE |
Title |
| IEC 61967-4:2002+AMD1:2006 CSV (2006-07) |
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 kHz TO 1 GHz - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 Ω/150 Ω DIRECT COUPLING METHOD |
| |
| Price Excl. VAT |
Total number of pages, tables and drawings |
|
286.00 €
|
65. |
Description
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
|
| Class |
C990
(IEC PUBLICATIONS IEC PUBLICATIONS)
|
| Status |
IEC PUBLICATION |
| Situation |
Currently active
|
|
| Committee |
TC 47/SC 47A
INTEGRATED CIRCUITS
|
| Responsible |
Ir DELENS Marc
|
| BEC Approval |
2006-07-27 |
| ICS-Code (International Standards Classification) |
31.200
|
|
| IEC publication date |
2006-07-27 |
| IEC stability date |
2021-12-31 |
| IEC last modification date |
2018-01-15 |
|
